Technical Program of Test Forum 2010

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Tuesday, November 23rd, 2010
Time
Titles Speakers or additional info
9:00-9:30
Registration  
9:30-9:40
Welcome/Introduction Knut Båtstoløkken
9:40-10:40
Key Note Session Chairman: Knut Båtstoløkken
9:40-10:40
The Real Cost of Not Testing! Michael Smith, Consultant
10:40-11:20
Exhibitor presentation Chairman: Jürgen Sedlacek
11:20-11:50
Coffee Break / Exhibition  
11:50-12:50
Session 1: Boundary Scan 1 Chairman: Bengt Magnhagen
11:50-12:20
IEEE 1149.7, 1149.8.1, 1149.1-2010, 1687 update: a tutorial Artur Jutman, Testonica Lab/ TU Tallinn
12:20-12:50
Test scheduling on IJTAG Erik Larsson, TU Linköping
12:50-13:50
Lunch  
13:50-15:20
Session 2: Functional Test Chairman: Birger Schneider
13:50-14:20
BIRST Support of LXI & PXI Matrices Shaun Fuller, Pickering
14:20-14:50
True flexible and modular test systems saves engineers time and money. Peter van Oostrom, 6TL
14:50-15:20
New test applications enabled by FPGA technology Vidar Grønås, NI
15:20-15:50
Coffee Break / Exhibition  
15:50-16:50
Session 3: Functional Test continued Chairman: Artur Jutman
15:50-16:20
Modular solutions for the future Bjørn Birkeland, 4Test
16:20-16:50
News from Conferences Chairman: Artur Jutman
16:50-17:15
Fruit & Refreshments / Exhibition  
17:15-19:00
Panel debate: The future of PXIe, LXI and AXI - shine or decline? Panel moderator: Birger Schneider
20:00
Dinner at FIRST Hotel Ambassadeur  
22:30
Social get-together in the Bar at First Hotel Ambassadeur
Wednesday, November 24th, 2010


Time
Titles Speakers or additional info
9:00-10:30
Session 4: Functional test 2 Chairman: Mick Austin
9:00-9:30
The Challenges in 3D Video Testing Birger Schneider, NI Engineering
9:30-10:00
In System Characterization and Test Using On-Chip Capture Control to Generate Failing Frequency Signatures Bill Eklow, Cisco
10:00-10:30
A coverage tool to explore the question "What
does it mean when the board test passes?"
Lars Kongsted Jensen, EP-TeQ
10:30-11:00
Coffee Break / Exhibition  
11:00-12:30
Session 5: Boundary Scan 2 Chairman: Bjørn B. Larsen
11:00-11:30
Boundary scan test of special boards Roger Hagebakken, Hapro
11:30-12:00
Advanced flash programming by processor assisted methods Jan Heiber, Goepel electronic GmbH
12:00-12:30
Case study of test solution based on functional test combined with boundary-scan testing Mick Austin, JTAG
12:30-13:30
Lunch  
13:30-15:00
Session 6: Test Strategies Chairman: Stig-Gunnar Jensen
13:30-13:50
Test development at Kitron Karl-Berge Rød, Kitron
13:50-14:20
ATML: Definitions and practice Andres Mellik, Juku Lab/TU Tallinn, Øystein Fallo, Virinco Tom Lomsdalen, Virinco
14:20-14:35
INEMI: Test Inspection Measurement. TWG Status Report Michael Smith, Consultant
14:35-15:00
Understanding DFT Methodologies Michael Smith, Consultant
15:00-15:10
Closing Session: concluding remarks Knut Båtstoløkken



Dinner and Social Get-Together

At 20:00, November 23rd we will enjoy a dinner in the hotel restaurant.

Exhibition

As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2 , as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.