Technical Program of Test Forum 2013

Tuesday, November 26th, 2013
Time
Titles Speakers or additional info
8:30-9:00
Registration  
9:00-9:15
Welcome/Introduction Knut Båtstoløkken
9:15-10:15
Key Note Session Chairman: Knut Båtstoløkken
9:15-10:15
Differences between IEEE 1149.1-2013 and IEEE P1687 Al Crouch, ASSET InterTech
10:15-10:45
Exhibitor Forum: short presentations Chairman: Mick Austin
10:45-11:15
Coffee Break / Exhibition  
11:15-12:45
Session1: Test Strategies and Test Quality Chairman: Birger Schneider
11:15-12:15
Controlling test and manufacuring process using WATS Mads Dahl, Eltek
Tom Andres Lomsdalen, Virinco
12:15-12:45
NI FlexRIO instruments for building innovative measurement systems for RF applications Orbel Sevoyan, National Instruments
12:45-13:45
Lunch  
14:00-15:30
Session 2: JTAG Based Test Chairman: Artur Jutman
14:00-14:30
Measuring passive components using IEEE1149.1 Marko Turpeenoja, BASS Solutions
14:30-15:00
Bit Error Rate Test (BERT) by FPGA Embedded Instruments Thomas Wenzel, Göpel electronic
15:00-15:30
Interactive debug of CPU and peripheral hardware via 1149.1 Port Marc van Houcke, JTAG Technologies
15:30-16:00
Coffee Break / Exhibition  
16:00-17:00
Session 3: Functional Test Chairman: Lars Kongsted-Jensen
16:00-16:30
Test system HW design that lasts for ever Linda Hellum, Kitron
16:30-17:00
Life cycle of testing Jaakko Ala-Paavola, Espotel
17:00-17:30
Fruits & Refreshments / Exhibition  
17:30-19:00
Panel debate: "What does Board Test look like in
5-10 years? Will Structural test be relevant?"
Panel moderator: Birger Schneider
19:30
Departure to the restaurant in the Old Town  
20:00
Dinner in the restaurant Troika at the Town Hall square  
23:00
Social get-together in the Bar back at Swissôtel (one free drink is offered)  


Wednesday, November 27th, 2013

Time
Titles Speakers or additional info
9:00-10:30
Session 4: Test Strategies and Test Quality Chairman: Mauri Aalto
9:00-09:30
DfX & Test Coverage Christophe Lotz, ASTER Technologies
09:30-10:00
COMPASS: The repair software and quality assurance software for all test systems Lothar Diez, SPEA
10:00-10:30
VPC Mass Interconnect - Scalable Solutions Werner Pinter, Virginia Panel
10:30-11:00
Coffee Break / Exhibition  
11:00-13:00
Session 5: Invited speaker and tutorial Chairman: Magnus Rönnqvist
11:00-12:00
From 2D Boards to 3D Chips: Test and DfT Challenges and Solutions Erik Jan Marinissen, IMEC
12:00-13:00
Synthetic Test Lars Johansson, Syntronic
13:00-14:00
Lunch  
14:00-15:30
Session 6: Embedded instrumentation Chairman: Erik Larsson
14:00-14:30
Accessing embedded instruments through the life-cycle of a chip using P1687 Farrokh Ghani Zadegan, University of Linköping
14:30-15:00
Securing your system with P1687 Jennifer Lynn Dworak, Southern Methodist University
15:00-15:30
Board and SoC Test Instrumentation for Ageing and No Failure Found Artur Jutman, Testonica Lab
15:30-15:45
Closing Session: concluding remarks Knut Båtstoløkken

Exhibition

As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.

Dinner

Please note, that the conference dinner on November 26th will be held outside the conference hotel. We will visit a medieval restaurant Troika located on Town Hall square in the Old Town 1.2 km away from Swissotel. All Test Forum participants are kindly requested to be in the hotel lobby at 19:30 where we will start our walk to the restaurant. After the dinner, all prticipants are invited back to Swissotel in a bar where one free drink will be offered to everyone.

Poster Sessions

As a new activity, we this year institute a Poster Session. It consists of a poster board for each poster presentation, approximately 1,5 m wide x 0,75 m high. The intention is that presenters can put copies of their main slides up on the poster board wall right after a session ends. That will enable attendees and presenters to get into a more detailed discussion on specific issues of the presentation that may otherwise not be handled in the short Q&A interval after each presentation. Each presenter will have a poster board available. After the break, the poster boards need to be cleared to make room for poster for the following session.
The poster material itself can be as simple as simple A4 copies of essential slides, and possibly some additional info, and/or it can be more advanced printouts supporting the views of the previous presentation.
We hope that the poster session will contribute further to the exchange of concepts and ideas and lead to fruitful discussions, hence stimulate the general transfer of knowledge.

Nordic Test Forum (NTF) Annual Assembly, November 25th 2013

The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 25th at 20:00. The agenda and motions will be dispatched to the members in a separate mailing.

If you do not intend to participate in the Annual Assembly, the Test Forum 2013 starts with registration on November 26th from 8:30 to 9:00.