Technical Program of Test Forum 2016 v2.3


Tuesday, November 29th, 2016
Time
Titles
Speakers or additional info
08:30-08:50
Registration
 
08:50-09:00
Welcome / Introduction
Knut Båtstoløkken
09:00-10:00
Key Note Session
Chairman: Knut Båtstoløkken
09:00-10:00
Innovative products developed in Lithuania
Vytautas Jokužis, UAB Elinta
10:00-10:30
Exhibitor Forum: short presentations
Chairman: Mick Austin
10:30-11:00
Coffee Break / Exhibition
 
11:00-12:30
Session 1: Structural test and test data
Chairman: Birger Schneider
11:00-11:30
Advanced SPI technology
Mr. Jang Woong, PARMI
11:30-12:00
Can board tester satisfy all the needs?
Lothar Diez, SPEA
12:00-12:30
Having the right data & information at the right time: Utopia or Reality?
Ignace Braem, Siemens Industry Software
12:30-13:30
Lunch
 
13:30-15:00
Session 2: Test Strategies and Test Quality 1
Chairman: Stig-Gunnar Jensen
13:30-14:00
Complete Integration of Test and Inspection Machines for PCB Manufacturing
Mark Laing, Valor
14:00-14:30
Test Coverage 4.0: How to build a consistent design to test flow in order to deliver defect-free PCBA
Christophe Lotz, Aster Technologies
14:30-15:00
Screening out marginal defects and outliers passing functional test
Artur Jutman, Sergei Odintsov, Testonica Lab
15:00-15:30
Coffee Break / Exhibition
 
15:30-16:30
Session 3: Test automation, Robotics for test engineering
Chairman: Bjørn B. Larsen
15:30-16:00
Automation of test: what's solutions, and how to implement it
Jacques Bonnement, Teradyne
16:00-16:30
In-line functional testing
Raimedas Sodaitis, UAB Kitron
16:30-17:00
News from conferences
Chairman: Artur Jutman
17:00-17:30
Fruit & Refreshments / Exhibition
 
17:30-19:00
Panel debate: "Can automation take us to new levels in test quality and efficiency"
Panel moderator: Birger Schneider
19:30
Dinner
 

Wednesday, November 30th, 2016
Time
Titles
Speakers or additional info
9:30-11:00
Session 4: Functional test and failure analysis
Chairman: Stig-Gunnar Jensen
9:30-10:00
PXI Digital Pattern Instrument
Armen Hakobyan, National Instruments
10:00-10:30
Easy tools for detecting pre- and post-failure parameters for corrosion analysis on printed circuit board assemblies
Vadimas Verdingovas, EC-RAT ApS
10:30-11:00
Production test considerations at small to medium volume factory. What do customers want?
Rolf Østvik, AXXE
11:00-11:30
Coffee Break / Exhibition
 
11:30-13:00
Session 5: JTAG based test
Chairman: Lars Kongsted-Jensen
11:30-12:00
Advanced testing of prototypes and manufacturing with JTAG Embedded Diagnostic OS
Jan Heiber, Göpel
12:00-12:30
Using JTAG Functional Test in LabView to Test microprocessor or FPGA peripheral devices
Mick Austin, JTAG Technologies
12:30-13:00
IEEE1149.1 TAP accessible embedded test solutions to tackle challenges in production testing
Mika Pussinen, Nokia Networks, Oulu
13:00-14:00
Lunch
 
14:00-14:50
Session 6: Test Strategies and Test Quality 2
Chairman: Raimedas Sodaitis
14:00-14:30
Mining the Test Data Motherlode
Ari Pihlajavesi, Predisys
14:30-14:50
How to accelerate vibration test via Fatigue Damage Spectrum
Pavel Fišer, Vibration Research
14:50-15:00
Closing Session: TestForum concluding remarks
Knut Båtstoløkken Kitron

Exhibition

As usually, a mini exhibition will take place in frames of TestForum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.

Dinner

The conference dinner on November 29th will be held at the conference hotel. After the dinner, all participants are invited back to the bar.

Nordic Test Forum (NTF) Annual Assembly, November 28th 2016

The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 28th at 20:00. The agenda and motions has been dispatched to the members in a separate mailing.

If you do not intend to participate in the Annual Assembly, the Test Forum 2016 starts with registration on November 28th from 8:30 to 8:50.