Program
The program is also available as pdf.
This page was updated
16.05.2007
.
NTF06 -- 28 - 29 November 2005 |
||
Day 1 - Tuesday 28 November | ||
Time | Title | Presenter and other info |
09:00 |
Registration |
|
09:30 |
Welcome/Introduction |
Mick Austin |
09:40 |
Key Note Session |
Chairman: Knut Båtstoløkken |
09:40 |
Challenges of Testing Over Innovation Life Cycle
|
Tauno Jokinen, Oulu University |
11:00 |
Session 1 |
Chairman: Bjørn B. Larsen |
11:00 |
Functional Board Test - Coverage Analysis
What does it mean when a functional test passes? |
Pete Collins, Aster Ingénierie |
11:30 |
Exhibitor presentations |
Chairman: Bjørn B. Larsen |
12:00 | Exhibition | |
12:30 | Lunch | |
13:30 |
Session 2 |
Chairman: Mick Austin |
13:30 |
LXI-the fastest growing instrumentation platform ever introduced |
Peter Allum, VXI Technology |
14:00 |
Create and Reconfigure Test Systems Faster with LXI Synthetic |
Matti Meuronen., Agilent Technologies Finland |
15:00 |
Coffee Break/Exhibition |
|
15:30 |
High speed serial device testing, PCI Express an enabling
technology |
Leif Johansson, NI |
16:00 |
Choosing a PXI Strategy
|
Jyrki Piispa, Tellabs |
16:30 |
Concept for Life-Cycle Testing of Electronic Devices by Means of
Universal Test Communication Standard |
Tuomas Happonen, University of Oulu |
17:00 |
Fruit & Refreshments / Exhibition |
|
17:15 | News from conferences | Mick Austin; EBTW, Artur Jutman, BTW, Mike Smith; ITC |
17:45 |
Panel debate: "Selecting the right instrument bus" |
Panel moderator: Birger Schneider |
20:00 | Dinner | |
21:30 | Social get-together | |
Day 2 - Wednesday 29 November 2006 | ||
Time | Title | Presenter |
09:00 |
Session 3 |
Chairman: Stig Gunnar Jensen |
09:00 |
The Economics of ICT, AOI vs AXI
|
Michael J. Smith, Teradyne |
09:45 |
AOI and X-Ray Inspection. Is it worth the cost of Investment? |
Keith Bryant, Dage |
10:15 |
Coffee Break |
|
10:30 |
The impact of board AXI test on the Performance of DRAM |
Bill Eklöw, Cisco (presented by Mick Austin) |
11:00 |
Optimization Model for Production Test Management |
Matti Mottonen, University of Oulu |
11:30 |
Exhibition |
|
12:00 |
Lunch |
|
13:00 |
Session 4 |
Chairman: Artur Jutman |
13:00 |
A Flexible Cost-Effective Solution for Deploying Boundary-Scan |
Anthony Sparks, JTAG Technologies Inc |
13:30 |
Power of manual programming in Boundary scan |
Gerhard Vieweg, Göpel |
14:00 |
Coffee Break |
|
14:30 |
S-JTAG and other Boundary Scan standards update |
Thomas Kronqvist, SAAB Test Systems |
15:00 |
Fixturing Guidelines
|
Michael J. Smith, Teradyne |
15:30 15:45 |
Test Forum Close |
Knut Båtstoløkken |