Program

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16.05.2007

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NTF06 -- 28 - 29
November 2005
Day 1 - Tuesday 28 November
Time Title Presenter and other info
09:00

Registration

 
09:30

Welcome/Introduction

Mick Austin

09:40

Key Note Session

Chairman: Knut Båtstoløkken

09:40
Challenges of Testing Over Innovation Life Cycle
Tauno Jokinen, Oulu University
11:00

Session 1

Chairman: Bjørn B. Larsen

11:00
Functional Board Test - Coverage Analysis

What does it mean when a functional test passes?
Pete Collins, Aster Ingénierie
11:30

Exhibitor presentations

Chairman: Bjørn B. Larsen

12:00 Exhibition  
12:30 Lunch  
13:30

Session 2

Chairman: Mick Austin

13:30

LXI-the fastest growing instrumentation platform ever introduced

Peter Allum, VXI Technology
14:00

Create and Reconfigure Test Systems Faster with LXI Synthetic
Instruments

Matti Meuronen., Agilent Technologies Finland
15:00

Coffee Break/Exhibition

 
15:30
High speed serial device testing, PCI Express an enabling
technology
Leif  Johansson, NI
16:00
Choosing a PXI Strategy
Jyrki Piispa, Tellabs
16:30
Concept for Life-Cycle Testing of Electronic Devices by Means of
Universal Test Communication Standard 
Tuomas Happonen, University of Oulu
17:00

Fruit & Refreshments / Exhibition

 
17:15 News from conferences Mick Austin; EBTW, Artur Jutman, BTW, Mike Smith; ITC
17:45

Panel debate: "Selecting the right instrument bus"

Panel moderator: Birger Schneider

20:00 Dinner  
21:30 Social get-together  
Day 2 - Wednesday 29 November 2006
Time Title Presenter
09:00

Session 3

Chairman: Stig Gunnar Jensen

09:00
The Economics of ICT, AOI vs AXI
Michael J. Smith, Teradyne
09:45

AOI and X-Ray Inspection. Is it worth the cost of Investment?

Keith Bryant, Dage
10:15

Coffee Break

 
10:30

The impact of board AXI test on the Performance of DRAM

Bill Eklöw, Cisco

(presented by Mick Austin)
11:00

Optimization Model for Production Test Management

Matti Mottonen, University of Oulu
11:30

Exhibition

 
12:00

Lunch

 
13:00

Session 4

Chairman: Artur Jutman

13:00

A Flexible Cost-Effective Solution for Deploying Boundary-Scan
Applications into Production

Anthony Sparks, JTAG Technologies Inc
13:30

Power of manual programming in Boundary scan

Gerhard Vieweg, Göpel
14:00

Coffee Break

 
14:30

S-JTAG and other Boundary Scan standards update

Thomas Kronqvist, SAAB Test Systems
15:00
Fixturing Guidelines 
Michael J. Smith, Teradyne
15:30 15:45

Test Forum Close

Knut Båtstoløkken