Keynote Speakers

Michael J Smith

Michael J Smith is currently a technologist for
Teradyne’s Assemble Test Division based in North Reading
Mass. He has over twenty years of experience with
Automatic Test Equipment starting with simulator based
functional test systems in the early 80’s, through to
traditional electrical inspection systems, image based
inspection systems and process monitoring and control.
He has written numerous papers and articles as well as
being the National Electronics Manufacturing Initiative
(NEMI) Roadmapping Chair for Test and Inspection in 2000
and 2002 and IPC Technical Committee Member for APEX
2002,2003 and 2004. With a European background in
technical support and sales he has been actively
involved in product development based on his
relationships with major customers worldwide.