Program
Seminar in cooperation with Elekronik EP 2005.
This is an open seminar at EP 05, Älvsjö, Sweden, which you may join without any registration. Some presentations are repeated, and you
may enter when it suits you.
Presentation abstracts are listed here.
| Tuesday 1 February | ||
| Time | Title | Company |
| 10.00 | Triple Play via enhanced DSL | Acterna |
| 10.30 | Driving factors that cause Signal Integrity issues and how to solve them | Orbis/Tektronix |
| 11.00 | Application Testing - Integration of Protocol stack and higher layers for multimedia mobiles | Anritsu |
| 11.30 | Balanced measurements with Network Analyzers | Rohde & Schwarz |
| 12:00 | Lunch | |
| 14.00 | The Impact of Low Voltage Technology on Electrical Test | Teradyne |
| 14.30 | Future of Test | Agilent |
| 15.00 | Boundary Scan in System Test | SAAB Test Systems |
| 15.30 | Understanding AXI Acquisition Techniques and Image Quality | Teradyne |
| 16:00 | End | |
| Wednesday 2 February | ||
| 10.00 | The Real Flying Prober: Problems & Solutions | DESAB |
| 10.30 | Fiber Testing in the Future - Broadband distribution networks | Acterna |
| 11.00 | Future of Test | Agilent |
| 11.30 | Stop failures using HALT! | DELTA |
| 12:00 | Lunch | |
| 14.00 | Ensuring BER Performance at Interfaces Using Timing Jitter Measurement Technologies | Orbis/Tektronix |
| 14.30 | Smart signal analyzing with connectivity to simulation software | Anritsu |
| 15.00 | Balanced measurements with Network Analyzers | Rohde & Schwarz |
| 15.30 | Technologies for improving time-correlation in mixed signal measurements | National Instruments |
| 16:00 | End | |
| Thursday 3 February | ||
| 10.00 | Challenges in Analyzing and Characterization of High Speed Serial Buses | Agilent |
| 10.30 | Electrical and Optical Instruments: Acoustic Camera | Acoutronic |
| 11.00 | Technologies for improving time-correlation in mixed signal measurements | National Instruments |
| 11.30 | The Real Flying Prober: Problems & Solutions | DESAB |
| 14.00 | Triple Play via enhanced DSL | Acterna |
| 14.30 | Driving factors that cause Signal Integrity issues and how to solve them | Orbis/Tektronix |
| 15.00 | Application Testing - Integration of Protocol stack and higher layers for multimedia mobiles | Anritsu |
| 15.30 | Stop failures early using HALT! | DELTA |
| 16:00 | End | |