Technical Program of Test Forum 2013
Tuesday, November 26th, 2013
Time
|
Titles | Speakers or additional info |
8:30-9:00
|
Registration | |
9:00-9:15
|
Welcome/Introduction | Knut Båtstoløkken |
9:15-10:15
|
Key Note Session | Chairman: Knut Båtstoløkken |
9:15-10:15
|
Differences between IEEE 1149.1-2013 and IEEE P1687 | Al Crouch, ASSET InterTech |
10:15-10:45
|
Exhibitor Forum: short presentations | Chairman: Mick Austin |
10:45-11:15
|
Coffee Break / Exhibition | |
11:15-12:45
|
Session1: Test Strategies and Test Quality | Chairman: Birger Schneider |
11:15-12:15
|
Controlling test and manufacuring process using WATS | Mads Dahl, Eltek Tom Andres Lomsdalen, Virinco |
12:15-12:45
|
NI FlexRIO instruments for building innovative measurement systems for RF applications | Orbel Sevoyan, National Instruments |
12:45-13:45
|
Lunch | |
14:00-15:30
|
Session 2: JTAG Based Test | Chairman: Artur Jutman |
14:00-14:30
|
Measuring passive components using IEEE1149.1 | Marko Turpeenoja, BASS Solutions |
14:30-15:00
|
Bit Error Rate Test (BERT) by FPGA Embedded Instruments | Thomas Wenzel, Göpel electronic |
15:00-15:30
|
Interactive debug of CPU and peripheral hardware via 1149.1 Port | Marc van Houcke, JTAG Technologies |
15:30-16:00
|
Coffee Break / Exhibition | |
16:00-17:00
|
Session 3: Functional Test | Chairman: Lars Kongsted-Jensen |
16:00-16:30
|
Test system HW design that lasts for ever | Linda Hellum, Kitron |
16:30-17:00
|
Life cycle of testing | Jaakko Ala-Paavola, Espotel |
17:00-17:30
|
Fruits & Refreshments / Exhibition | |
17:30-19:00
|
Panel debate: "What does Board Test look like in 5-10 years? Will Structural test be relevant?" |
Panel moderator: Birger Schneider |
19:30
|
Departure to the restaurant in the Old Town | |
20:00
|
Dinner in the restaurant Troika at the Town Hall square | |
23:00
|
Social get-together in the Bar back at Swissôtel (one free drink is offered) | |
Wednesday, November 27th, 2013 |
||
Time
|
Titles | Speakers or additional info |
9:00-10:30
|
Session 4: Test Strategies and Test Quality | Chairman: Mauri Aalto |
9:00-09:30
|
DfX & Test Coverage | Christophe Lotz, ASTER Technologies |
09:30-10:00
|
COMPASS: The repair software and quality assurance software for all test systems | Lothar Diez, SPEA |
10:00-10:30
|
VPC Mass Interconnect - Scalable Solutions | Werner Pinter, Virginia Panel |
10:30-11:00
|
Coffee Break / Exhibition | |
11:00-13:00
|
Session 5: Invited speaker and tutorial | Chairman: Magnus Rönnqvist |
11:00-12:00
|
From 2D Boards to 3D Chips: Test and DfT Challenges and Solutions | Erik Jan Marinissen, IMEC |
12:00-13:00
|
Synthetic Test | Lars Johansson, Syntronic |
13:00-14:00
|
Lunch | |
14:00-15:30
|
Session 6: Embedded instrumentation | Chairman: Erik Larsson |
14:00-14:30
|
Accessing embedded instruments through the life-cycle of a chip using P1687 | Farrokh Ghani Zadegan, University of Linköping |
14:30-15:00
|
Securing your system with P1687 | Jennifer Lynn Dworak, Southern Methodist University |
15:00-15:30
|
Board and SoC Test Instrumentation for Ageing and No Failure Found | Artur Jutman, Testonica Lab |
15:30-15:45
|
Closing Session: concluding remarks | Knut Båtstoløkken |