Technical Program of Test Forum 2019

Download the Technical Program as a PDF here! Updated 2019.11.19.
Tuesday, November 26th, 2019
Time Titles Speakers or additional info
08:30-08:50 Registration  
08:50-09:00 Welcome / Introduction Knut Båtstoløkken
09:00-10:00 Key Note Session Chairman: Knut Båtstoløkken 
09:00-10:00 Ericsson Estonia Journey to Intelligent Manufacturing and Augmented Reality Troubleshooting Welix Klaas, Ericsson Eesti AS
10:00-10:30 Exhibitor Forum: short presentations Chairman: Mick Austin
10:30-11:00 Coffee Break / Exhibition  
11:00-12:30 Session 1: Test Strategies, reliability, structural test Chairman: Stig-Gunnar Jensen
11:00-11:30 In search for the right way of production testing Lauri Anttila, Planmeca Oy
11:30-12:00 Can NZT be used as tool to find Shorts? Lothar Diez, SPEA
12:00-12:30 Mitigating JTAG as an Attack Surface Reg Waller , ASSET InterTech
12:30-13:30 Lunch  
13:30-15:00 Session 2: Structural Test Chairman: Mattias Ericsson
13:30-14:00 New ICT technology Frank Grossmann, ATEip
14:00-14:30 Total Solutions of TRI’s Automated X-ray Inspection Anthony Wang, TRI
14:30-15:00 Top test coverage will only be achieved in combination with AXI Andreas Türk, GÖPEL electronic
15:00-15:30 Coffee Break / Exhibition  
15:30-16:30 Session 3: Test Automation Chairman: Magnus Rönqvist
15:30-16:00 In-line RF Electronics Testing Challenges Ramon Llavall, 6TL
16:00-16:30 Smart Electronic Factory – How Autonomous Intelligent Vehicles change it to a Smart CONNECTED Electronic Factory Mr. Alfred Pammer, CTS, Germany
16:30-17:00 News from conferences Chairman: Artur Jutman
17:00-17:30 Fruit & Refreshments / Exhibition  
17:30-19:00 Panel debate: Panel moderator: Birger Schneider 
“Should a test remain stable through lifetime of a product – or adapt to realities?”
19:30 Dinner  
Wednesday, November 27th, 2019
Time Titles Speakers or additional info
09:00-10:30 Session 4: Functional test, fixturing and test interfaces Chairman: Mats Klarholm
09:00-09:30 Simple DIY functional tester Artur Jutman, Testonica Lab
09:30-10:00 Maximising Functional Test Fixture Performance by Eliminating Cables Gary Clayton, MacPanel
10:00-10:30 Contact technologies for high reliable repetitive testing Mads Haastrup, ODU
10:30-11:00 Coffee Break / Exhibition  
11:00-12:30 Session 5: JTAG Based Test Chairman: Paulius Musteikis
11:00-11:30 Emulation based Boundary Scan tests Jan Heiber, GÖPEL
11:30-12:00 Functional port for accessing on-chip instruments Erik Larsson, Lund University
12:00-12:30 Case study –Testing a PCBA with BGAs using boundary scan and JFT Lauri Anttila, Planmeca Oy
12:30-13:30 Lunch  
13:30-15:00 Session 6: Mixed session Chairman: Lars Kongsted-Jensen
13:30-14:00 Thermal design and subsequent temperature stressing  – a challenge for LED lighting and power electronics Birger Schneider, Chamaj
14:00-14:30 Embedded FPGA-based Test for BGAs Power/Ground Solder Joints Sergei Odintsov, TalTech
14:30-15:00 New Flashing methods Samuele Stefanoni, SMH Technologies
15:00-15:10 Closing Session: TestForum concluding remarks Knut Båtstoløkken Kitron 


As usually, a mini exhibition will take place in frames of TestForum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.


The conference dinner on November 26th will be held in Restaurant Peppersack located close to the Townhall Square in the Old Town.

Make sure to come back to the conference hotel for your free beer at the pub in VIRU hotel

Nordic Test Forum (NTF) Annual Assembly, November 25th 2019

The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 25th at 20:00. The agenda and motions has been dispatched to the members in a separate mailing.

If you do not intend to participate in the Annual Assembly, the Test Forum 2019 starts with registration on November 26th from 8:30 to 8:50.