Technical Program of Test Forum 2011

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Tuesday, November 22nd, 2011
Time
Titles Speakers or additional info
8:30-9:00
Registration  
9:00-9:10
Welcome/Introduction Knut Båtstoløkken
9:10-10:10
Key Note Session Chairman: Knut Båtstoløkken
9:10-10:10
How to manage a global manufacturing network Timo Luukkala, NSN
10:10-10:40
A Modular and Cost Effective Approach for
Testing 3GPPP LTE 		Andreas Gustavesson, NI
10:40-11:20
Exhibitor presentation
11:20-11:50
Coffee Break / Exhibition  
11:50-12:50
Session1: Boundary Scan Chairman:Jürgen Sedlacek
11:50-12:20
JTAG Not just a manufacturing tool Peter v/d Eijnden, JTAG Technologies
12:20-12:50
Advanced Boundary Scan Test Method Mika Pussinen, NSN
12:50-13:50
Lunch  
13:50-15:20
Session 2: Embedded Instruments and Emulation. Chairman: Bengt Magnhagen
13:50-14:20
Protocol driven interface validation based on
processor emulation		 Jan Heiber, Göpel Electronic
14:20-14:50
FPGA-Enabled Embedded Instrumentation Platform
for JTAG Test		 Sergei Devadze, Testonica Lab, TU Tallinn
14:50-15:20
Adaptive test system to speed up PCB Testing Jörg Sachße, TU Ilmenau
15:20-15:50
Coffee Break / Exhibition  
15:50-16:20
Session 3: Boundary Scan 2 Chairman: Artur Jutman
15:50-16:20
Deployment of JTAG based HW self-test in RBS 6000 Gunnar Carlsson Ericsson
16:20-16:50
News from Conferences  
16:50-17:15
Fruits & Refreshments / Exhibition  
17:15-19:00
Panel debate: Is Boundary Scan Testing starting to lose steam to alternatives in Structural Testing? Panel moderator: Birger Schneider
20:00
Dinner  
22:30
Social get-together in the Bar  



Wednesday, November 23rd, 2011
Time
Titles Speakers or additional info
9:00-9:30
Invited Speaker Chairman: Knut Båtstoløkken
9:00-9:30
Operator or Machine driven Test Jyrki Sippola, NOKIA
9:30-10:30
Session 4: Test Strategies Chairman: Matti Kemppainen
9:30-10:00
The printed electronics reliability testing results Juha-Veikko Voutilainen UoO
10:00-10:30
A modular and cost effective approach to module chip testing Birger Schneider NI
10:30-11:00
Coffee Break / Exhibition  
11:00-12:30
Session 5: Functional Test Chairman: Mick Austin
11:00-11:30
Combining High performance ICT with PXI Functional Michael J Smith Teradyne
11:30-12:00
Modern test solutions based on several form factors Gabor Mezöfi Testhouse Nordic AB
12:00-12:30
Using Labview for the development of a modular and flexible PC-board test platform Peter van Oostrom, 6TL Engineering
12:30-13:30
Lunch  
13:30-15:00
Session 6: Test requirements Chairman:Stig Gunnar Jensen
13:30-14:00
Optimizing functional test Lars Kongsted-Jensen, EP-TeQ
14:00-14:30
From Customer requirements to test architecture Vesa Hekkala NSN
14:30-15:00
Seamless test transfer from R&D to Production Juha Ojaniemi Espotel
15:00-15:10
Closing Session: concluding remarks Knut Båtstoløkken




Dinner and Social Get-Together

At 20:00, November 22nd we will enjoy a dinner in the Winter Garden this will be followed by drinks in
the Gustava club or Lounge bar.

Exhibition

As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to
present their tools and methodologies related to production test. Exhibitors can make arrangements with
NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as
space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the
program for a brief introduction.

Nordic Test Forum (NTF) Annual Assembly, November 21st 2011

The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before
the Test Forum conference. This year it will be held on November 21st at 19:00. The agenda and motions
will be dispatched to the members in a separate mailing.

If you do not intend to participate in the Annual Assembly, the Test Forum 2011 starts with registration on
November 22nd from 8:30 to 9:00.