Program changes will be published here.
| NTF04 -- 30 November - 1 December 2004 |
| Day 1 - Tuesday 30 November |
| Time |
Title |
Presenter |
| 08:30 |
NTF Annual General Assembly |
|
| 10:00 |
Registration |
|
| 10:30 |
Welcome/Introduction |
Knut Båtstoløkken
Gunnar Carlsson |
| 10:40 |
Key Note Session |
Chairman: Knut Båtstoløkken |
| 10:40 |
Economics of Testing
|
Michael Wahl, University of Siegen |
| 11:30 |
Test Challenges and Changes
|
Bernard Sutton, Independent |
| 12:15 |
Exhibition |
|
| 12:45 |
Lunch |
|
| 13:45 |
Functional Test |
Chairman: Gunnar Carlsson |
| 13:45 |
Functional Test Objectives and Methods
|
Hans Högberg, Ericsson |
| 14:15 |
Mixed Signal Instruments for Coherent Test Applications
|
Johan Olsson, National Instruments |
| 14:45 |
Challenges in Integrating RF tests in Functional Test Systems
|
Birger Schneider, microLEX Systems AS |
| 15:15 |
Coffee Break |
|
| 15:45 |
RF Test |
Chairman: Birger Schneider |
| 15:45 |
A Modular Instrument Approach
|
Patrik Stenvard, Ericsson |
| 16:15 |
Bluetooth Radio Test and Qualification
|
Ragnar Lindholm, Rohde & Schwartz |
| 16:45 |
Bluetooth Test Solution
|
Magnus Björk, Elcoteq Tallinn |
| 17:15 |
Fruit & Refreshments |
|
| 17:45 |
News from Conferences |
Michael J. Smith, Pete Collins |
| 18:15 |
Should Functional Test Patch the Holes in the Process Control and Test? |
Panel moderator: Birger Schneider |
| 20:00 |
Dinner |
|
| 21:30 |
Social get-together |
|
| Day 2 - Wednesday 1 December |
| Time |
Title |
Presenter |
| 08:30 |
Structural Test |
Chairman: Bengt Magnhagen |
| 08:30 |
AOI/AXI
|
Michael J. Smith, Teradyne |
| 09:00 |
Using Flying Prober and Boundary Scan
|
Saeed Taheri, Acculogic |
| 09:30 |
The Impact of Low Voltage Technologies on In-Circuit Test
|
Michael J. Smith, Teradyne |
| 10:00 |
Coffe Break |
|
| 10:30 |
Standards Update |
Chairman: Mick Austin |
| 10:30 |
Mixed signal boundary scan, reality or myth?
|
Pete Collins, JTAG Technologies |
| 11:00 |
Advanced Digital Signal Boundary-scan (1149.6)
|
Ken Filliter, National Semiconductor |
| 11:30 |
P1500, a Standard for System on Chip DFT
|
Kim Petersén, HDC |
| 12:00 |
Exhibition |
|
| 12:30 |
Lunch |
|
| 13:30 |
Test Strategies, Test Economics and Advanced Test Techniques |
Chairman: Knut Båtstoløkken |
| 13:30 |
Using Boundary Scan Emulation for Functional Verification
|
Johan Renberg, ISS Group |
| 14:00 |
Calculation of Board Test Coverage.
|
Christophe Lotz, ASTER Ingenierie |
| 14:30 |
Coffe Break |
|
| 15:00 |
Strategist - A Test Strategy Tool
|
Michael J. Smith, Teradyne |
| 15:30 |
System Control of Remote Boundary Scan over I2C/IPMB
|
Gunnar Carlsson, Ericsson |
| 16:00 |
Test Forum Close |
Knut Båtstoløkken |
